معرفی
Dr. Xiangyu Xie is a Research Fellow at the Paul Scherrer Institute (PSI) in Switzerland, affiliated with the Laboratory for X-ray Nanoscience and Technologies (LXNT) under the PSI Center for Photon Science. His work focuses on advanced X-ray techniques and nanoscale materials analysis.
Contact: xiangyu.xie@psi.ch, +41 56 310 54 91, Forschungsstrasse 111, 5232 Villigen PSI, Switzerland.
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