Vockert, M.

Dr. M. Vockert is a researcher specializing in atomic physics and X-ray physics at GSI Helmholtzzentrum für Schwerionenforschung GmbH. He completed his PhD at Friedrich Schiller University Jena in 2022 with a dissertation on radiative electron capture as a source of highly linearly polarized X-ray radiation.

Dr. Vockert's research focuses on:

• Radiative electron capture processes
• X-ray polarization measurements
• Development of Compton polarimeters
• Atomic collisions with heavy ions
• Relativistic quantum effects in atomic processes

His recent publications demonstrate expertise in both theoretical calculations and experimental techniques for measuring and understanding polarized X-ray radiation. Dr. Vockert has contributed to the development of advanced instrumentation for X-ray polarization measurements, including Si(Li) detectors and polarization reconstruction algorithms. His work with double-sided segmented semiconductor crystals was developed within the SPARC collaboration.

Dr. Vockert collaborates with researchers across multiple institutions as evidenced by his co-authorship on numerous publications. His work has been published in reputable journals such as Physical Review A and presented at international conferences including the FAIR next generation scientists workshop.