Victor Soltwisch

Victor Soltwisch is a researcher at the Physikalisch-Technische Bundesanstalt (PTB), where he has served since 2012. Initially a postdoc in the EUV Radiometry working group, he became head of the EUV Nanometrology working group in 2019.

His educational background includes:

• Physics diploma in 2007 from the Free University of Berlin, with a focus on soft X-rays.
• Doctorate in 2012 on resonant X-rays applied to multiferroic systems, conducted at BESSY II.

Dr. Soltwisch's research spans X-ray metrology, nanometrology, and the study of multiferroic materials. He specializes in EUV radiation and the analysis of complex diffuse scattering patterns from nanostructured surfaces. A significant achievement was explaining a novel scattering phenomenon through multiple scattering theory, which, despite its complex derivation, had an elegantly simple mathematical solution involving the insertion of a tangent into known equations.

Motivated by the pursuit of understanding, he humorously cites wealth, power, fame, and towels as secondary drivers. His metrology work addresses fundamental measurement challenges at the nanoscale, emphasizing the interplay between experimental physics and theoretical insight.