Thomas E. Weirich

Thomas E. Weirich is an Associate Professor and Division Manager of FIB and TEM at the Central Facility for Electron Microscopy at RWTH Aachen University. His research focuses on advanced materials characterization using electron microscopy techniques, including TEM/STEM, FIB, and SEM. He specializes in crystallography, nanomaterials analysis, and the development of software tools for electron diffraction and microscopy data interpretation. Key areas of interest include phase formation in materials, structural stability under industrial conditions, and the application of electron microscopy to study alloys, ceramics, and nanowires.

Recent work includes developing software like RAPID-DM and FINDS for automated diffraction pattern analysis, and studies on laser processing, additive manufacturing, and rolling contact fatigue in steels. His contributions bridge fundamental material science with applied engineering solutions, particularly in aerospace and energy sectors.

Weirich collaborates extensively on interdisciplinary projects, contributing to the understanding of microstructural dynamics and material behavior under extreme conditions. His lab provides cutting-edge microscopy services to researchers across RWTH and partner institutions.