Sani Nassif

Sani Nassif is a Research Fellow at the Technical University of Munich (TUM) under the Rudolf Diesel Industry Fellowship, hosted by Professor Ulf Schlichtmann. With 28 years of experience at Bell Labs and IBM Research, he has led teams in integrated circuit modeling, simulation, statistical analysis, and optimization.

Research Interests: His work bridges integrated circuit technology with cross-disciplinary applications in medicine. Key areas include variability analysis in semiconductor manufacturing, low-power circuit design, and reliability engineering for nano-scale systems. He focuses on applying machine learning and statistical methods to solve challenges in energy-efficient computing and biomedical systems.

Selected Publications: His research spans circuit variability trends, leakage current modeling, and reliability frameworks for nano-era systems. Work includes foundational studies on SRAM failure analysis and CMOS scaling limitations.

Scientific Awards: He is recognized as an

• IEEE Fellow
• IBM Master Inventor (75 patents)
• Rudolf Diesel Industry Fellow