Sameera Pathiranage

Sameera Pathiranage is a postdoctoral researcher at North Carolina State University's Analytical Instrumentation Facility (AIF). His work focuses on surface analysis using advanced techniques like XPS, ToF-SIMS, and Confocal Raman Microscope.

• Ph.D. in Physics (2022), University of North Dakota
• B.Sc. in Physics (2016), University of Peradeniya, Sri Lanka

Research spans surface science, semiconductor materials, and energy storage technologies. Key areas include nanoscale characterization, thin film analysis, and electronic property measurements.

Recent work explores:

• Graphene-coated silicon anodes for lithium-ion batteries
• CrSi2 crystallite formation on silicon substrates
• Dielectric properties of silicon-based materials

Active member of the American Physics Society (APS).