معرفی
Nabil Bassim is an Associate Professor in the Department of Materials Science and Engineering at McMaster University and serves as Scientific Director of the Canadian Centre for Electron Microscopy (CCEM). His research focuses on advanced electron microscopy techniques, ion microscopy, nanofabrication, and beam-sample interactions, applied to nanomaterials, 2D materials, and structural materials like concrete and alloys. He holds a B.S. in Mechanical Engineering from the University of South Florida, and M.Sc. and Ph.D. degrees from the University of Florida.
Research interests include:
- Development of novel electron/ion microscopy techniques
- Nanomaterial synthesis and characterization
- Beam-induced damage and doping mechanisms
- Structural materials analysis
- Machine learning optimization for microscale processes
Recent publications demonstrate strong focus on semiconductor characterization, nanomaterials synthesis, and advanced microscopy techniques. Article trends highlight innovative approaches to nanoscale analysis, materials for energy applications, and correlative microscopy methods.
As Faculty Lead for McMaster Engineering's Aerospace and Defense Initiative, Dr. Bassim coordinates interdisciplinary research. He co-founded the FIB-SEM User Meeting and teaches graduate courses in electron/ion microscopy characterization techniques.
