
معرفی
Dr. Michael J. Havrilla is a Professor in the Department of Electrical Engineering at the Air Force Institute of Technology (AFIT), Wright-Patterson Air Force Base, Ohio. He holds a Ph.D. in Electrical Engineering from Michigan State University (2001), where he also earned his M.S. (1989) and dual B.S. degrees in Physics and Mathematics (1987).
His research lies at the intersection of applied electromagnetics and microwave engineering, with a strong emphasis on nondestructive material characterization, antenna measurement techniques, and the electromagnetic analysis of complex media. His work involves developing and refining waveguide-based probes and measurement systems for extracting the electromagnetic properties of materials, including anisotropic, magnetic, and high-temperature media.
His publication record shows a consistent focus on advancing measurement techniques, particularly using rectangular, dual-ridged, and coaxial waveguide probes. A significant trend in his recent articles is the characterization of anisotropic and complex media, the development of broadband and nondestructive sensors, and the theoretical underpinnings using dyadic Green's functions and potential formulations.
His scientific awards and recognitions include:
- Outstanding Service Award, Antenna Measurement Techniques Association (2019)
- Multiple Best Student Paper Awards at AMTA conferences for students he advised
- Election to the AMTA Board of Directors (2015)
- Elected Senior Member of IEEE and Full Member of URSI Commission B
- AFIT Instructor of the Quarter (2009)
Dr. Havrilla has advised numerous graduate students, many of whom have presented award-winning research. His work is supported by collaborations with researchers such as M. W. Hyde, E. Rothwell, and A. Bogle. He has also delivered invited talks on advanced topics in electromagnetics at international symposia.
He is actively involved in professional societies like IEEE, AMTA, and URSI, contributing significantly to the field through both research and service. His laboratory work focuses on RF and microwave measurement systems for material characterization.


