معرفی
Dr. Markus Kratzer is a Senior Lecturer at the Institute of Physics, Montanuniversität Leoben (Austria), specializing in nanoscale characterization of organic and inorganic semiconductor nanostructures. His habilitation thesis on Scanning Probe Microscopy applications in Materials Science was successfully defended in 2015.
- Research focus: Graphene and 2D materials, organic thin film growth, electrical/photoelectric properties of nanostructures
- Technical expertise: Conductive AFM, Photoconductive AFM, Kelvin Probe Force Microscopy, Piezoresponse Force Microscopy
He has coordinated multiple internationally funded projects and serves as a reviewer for prestigious journals like Nature Communications and ACS Applied Materials & Interfaces.
- Scientific Awards & Honors
- Best Poster Prize (2015, 2010)
- Applied Physics Letters Cover Art Designer (2015)
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