John A. Woollam

John A. Woollam is Professor of Electrical Engineering at the University of Nebraska-Lincoln and founder of J.A. Woollam Company. His research specializes in spectroscopic ellipsometry for optical characterization of thin films and surfaces.

His work spans vacuum ultraviolet to infrared spectral analysis of materials including semiconductors, biomaterials, and magnetic films. He developed multiple patented ellipsometer systems and methods for precise material characterization.

Publications show consistent focus on ellipsometry instrumentation and applications across diverse materials systems. Recent work includes biomedical film analysis while earlier contributions established semiconductor characterization standards.