معرفی
Dr. Jochen Stahn is an Instrument Scientist at the Paul Scherrer Institute (PSI) in Switzerland, leading the AMOR reflectometer facility. He specializes in neutron scattering techniques for studying advanced materials, with a focus on thin films, magnetic systems, and energy storage materials.
His research spans topics such as magnetic proximity effects in superconductors/ferromagnet multilayers, lithium ion battery materials, and interface engineering in nanostructured systems. He has pioneered developments in neutron optics including the Selene guide concept for enhanced reflectometry.
Key contributions include in-situ neutron reflectometry studies of thin film growth mechanisms, magnetic domain structure analysis, and neutron instrumentation advancements. His work integrates materials characterization with fundamental physics insights, addressing challenges in energy materials and spintronics.
Dr. Stahn has collaborated with international teams on ESS instrument development and led projects in neutron beam focusing systems. His research outputs include over 100 peer-reviewed articles, with emphasis on structural and dynamic properties of complex materials at the nanoscale.
