Eric Chason

Eric Chason is a Professor of Engineering at Brown University's School of Engineering, specializing in thin film evolution, materials diagnostics, and stress analysis. He earned his Ph.D. in Physics from Harvard University (1985) and conducted post-doctoral work at Gakushuin University and Sandia National Laboratories. His research focuses on in situ diagnostics for thin films, Sn whisker formation mechanisms, and ion sputtering processes, supported by NSF and DOE grants totaling over $12 million. He teaches courses in materials science, kinetics, and crystallography. Key awards include the 2019 TMS John Bardeen Award and DOE-BES recognition (1994). His lab develops tools like the Multi-Beam Optical Stress Sensor (MOSS) and Light Scattering Spectroscopy (LiSSP) for real-time material analysis.

• Education: Ph.D., Physics, Harvard University (1985); B.A., Harvard University (1979)
• Research Interests: Thin film stress, Sn whisker growth, ion beam patterning, and battery materials
• Awards: DOE-BES Award (1994), TMS Bardeen Award (2019), Sandia Excellence Awards
• Grants: NSF DMR (2020-2024), DOE EPSCoR ($12M+), and multiple industry collaborations
• Labs: Chason Lab at Brown, focusing on in situ diagnostics and materials characterization

His work bridges experimental and computational methods, with over 90 publications and contributions to books on thin films and Sn whisker mitigation.