Enrique Castaño Carmona

Enrique Castaño Carmona serves as Principal Researcher (Investigador Principal) at Asociación Centro Tecnológico Ceit (CEIT), a research institution formally linked to the University of Navarra in Spain. His primary academic affiliation remains with the University of Navarra, where he also completed his doctoral studies.

His educational background includes a PhD from the University of Navarra awarded in 1992. The doctoral thesis, supervised by Dr. José Jabier Urkola Galarza, investigated electromigration phenomena under bidirectional and pulsed currents with the title: "Influence of microstructure and line geometry on electromigration under bidirectional (bc) and pulsed (pdc) currents".

Dr. Castaño Carmona's research centers on materials degradation mechanisms in microelectronic systems, specifically examining how microstructure and interconnect geometry affect electromigration reliability. His work bridges fundamental materials science with practical semiconductor engineering challenges, addressing critical failure modes in integrated circuits under non-steady-state current conditions. This research has direct implications for advancing semiconductor manufacturing and device longevity in modern electronics.

As a core researcher at CEIT, he contributes to the center's mission of industrial-applied technological development, collaborating with academic and corporate partners on materials engineering solutions within Navarra's innovation ecosystem.