Don M.J. van Elst

Don M.J. van Elst is a Doctoral Candidate at Eindhoven University of Technology (TU/e) in the photonics and semiconductor nanophysics group (PSN) since November 2020. His research focuses on developing compact near-infrared spectral sensors with practical applications in agriculture, aiming to "put the power of spectral sensing in the hands of farmers".

His primary research areas include spectral sensing, photodetector engineering, resonant cavity design, and semiconductor nanophysics. His work contributes to UN Sustainable Development Goals through resource-efficient agricultural technologies. The fingerprint of his research shows strong expertise in Photodetector Engineering (100%), Resonant Cavity Engineering (89%), and Linewidth/Lithography (75%).

His recent publications demonstrate a clear trajectory toward practical sensor applications, with emphasis on optimizing spectral resolution, extending sensor response capabilities, and integrating CMOS technology for field-deployable devices. His 2025 publications in ACS Photonics, ACS Nano, and Sensors journals highlight significant advances in picometer-level precision and material sensing capabilities.

He actively contributes to multiple research projects including Fiber sensors for microchemistry (2024-2025), NIR spectral sensing for wearables (2023-2028), Synergia (2020-2027), and the PSN Research Centre for Integrated Nanophotonics (2014-2025).

Van Elst completed both his bachelor's and master's degrees in Applied Physics at TU/e, with a master's internship at MIT's Spin Dynamics Laboratory. His graduation thesis was developed at Philips Research on Eindhoven's High Tech Campus.