معرفی
Dominic Greiffenberg is a researcher at the Paul Scherrer Institute (PSI), focusing on the development of High-Z sensors for advanced X-ray detection. He is affiliated with the Laboratory for X-ray Nanoscience and Technologies, where he leads technical advancements in detector hybridization and characterization.
- Education: PhD in physics from the University of Freiburg (Germany), with research at the University of Karlsruhe and international stays at Czech Technical University and University of Canterbury.
His research targets extending detector energy ranges beyond silicon limitations, particularly for photon energies above 20 keV. He employs high-granularity detectors like JUNGFRAU/MONCH to study spectral information and sensor optimization. Recent publications highlight work on GaAs:Cr sensors, radiation hardness, and hybrid pixel detector simulations.
Key trends in his publications (2021–2025) include advancements in soft X-ray detection, radiation-hard materials, and on-chip digitization techniques. Collaborations span institutions like European XFEL and teams working on synchrotron radiation.
