Daren Mueller

Daren Mueller is a Professor and Extension Plant Pathologist at Iowa State University, coordinating the Integrated Pest Management (IPM) program and co-directing the North Central IPM Center and Crop Protection Network. He holds a B.S. from the University of Wisconsin-Madison (1996), and M.S. and Ph.D. in Plant Pathology from the University of Illinois (1999 and 2001, respectively).

His research focuses on field crop diseases, particularly soybean pathology, fungicide efficacy, and integrated pest management strategies. Key projects include studying Diaporthe species sensitivity to fungicides, developing real-time insect identification systems via machine learning (e.g., InsectNet and AgGym), and analyzing the impact of seed treatments on crop disease. Mueller also leads initiatives to quantify yield losses from diseases and pests through online tools like the Field Crop Yield Loss Calculator.

Publications highlight advancements in soybean sudden death syndrome management, fungal endophyte community dynamics, and the spread of Phyllachora species causing maize tar spot. His work bridges laboratory research with practical applications for farmers, emphasizing sustainable agricultural practices and technology-driven pest monitoring.