معرفی
Cora Salm is a Lecturer in the Department of Integrated Devices and Systems at the University of Twente, affiliated with the MESA+ Institute for Nanotechnology. Her research focuses on semiconductor device reliability, hot-carrier effects, and microelectromechanical systems (MEMS). She has contributed to studies on device degradation mechanisms, environmental impact on materials, and advanced fabrication techniques for high-performance electronics.
Key research areas include hot-carrier degradation in MOSFETs, environmental recovery phenomena, and reliability of RFID tags under thermal stress. Her work spans semiconductor materials, plasma processing, and the integration of MEMS with CMOS technologies. Notable collaborations involve investigations into LHC dipole circuit transients and radiation detector development using wafer post-processing.
Recent publications highlight advancements in understanding charge trapping dynamics, humidity effects on ferroelectric capacitors, and RF MEMS switch characterization. She has presented at multiple international conferences and contributed to proceedings on microelectronics education and semiconductor reliability.
