Chulsoon Hwang

Dr. Chulsoon Hwang is an Associate Professor of Electrical Engineering at Missouri University of Science and Technology (Missouri S&T), part of the College of Engineering. He leads the EMC Laboratory and focuses on RF desensitization, signal/power integrity, machine learning in hardware design, and electromagnetic interference (EMI). His work bridges theoretical electromagnetics with practical applications in high-speed digital systems and hardware security.

Education: Ph.D., M.S., and B.S. in Electrical Engineering from KAIST (Korea Advanced Institute of Science and Technology), Daejeon, South Korea. Prior to joining Missouri S&T in 2015, he worked as a Senior Engineer at Samsung Electronics (2012–2015).

Research Highlights:

• Developed machine learning-driven simulators for signal integrity (e.g., High-speed Channel Transformer).
• Pioneered physics-assisted genetic algorithms for PDN decoupling optimization.
• Explored intentional EMI attacks (e.g., inaudible voice command injection into smart speakers).
• Advanced understanding of power supply-induced jitter (PSIJ) and EMI mitigation strategies.

Recent Trends in Publications: Focus on AI-driven hardware optimization (deep learning/RL for PDN design), EMI/RFI modeling, and security vulnerabilities in IoT devices. Over 150 IEEE publications and multiple patents (e.g., inaudible voice command injection, laser foil printing for resonators).

Awards and Recognition:

• Best Paper Awards (7 papers, 4 student papers).
• Dean’s Scholar Award (2022–2023) and IEEE EMC Society Technical Achievement Award (2023).
• Google Faculty Research Award (2020) and APEMC Young Scientist Award (2018).

Grants and Labs: Active in securing research grants for AI-driven hardware design and EMI mitigation. The EMC Lab collaborates on industry-relevant projects, such as acoustic noise analysis in power distribution networks.

Labs/Teams: Director of the EMC Laboratory at Missouri S&T, fostering interdisciplinary research in electromagnetics and hardware security.