معرفی
Christian Kumpf is a Professor at RWTH Aachen University (Department of Experimentalphysik IV A) and Group Leader/Professor at Forschungszentrum Jülich (Peter Grünberg Institut, PGI-3). He obtained his education at Friedrich-Alexander-Universität Erlangen-Nürnberg (Diplom Physik), University of Rostock (Dr. rer. nat.), and Julius-Maximilians-Universität Würzburg (Dr. habil.), with postdoctoral training at Forskningscenter Risø.
His research specializes in surface science and nanoscale characterization, with key interests in:
- Electron and X-ray diffraction techniques
- Aberration-corrected spectromicroscopy
- Epitaxial growth of 2D materials (graphene, bismuthene, h-BN)
- Molecular adsorption and interface structures
- Quantum materials characterization
- Real-time surface imaging
Recent publications (2019-2025) focus on quantum materials interfaces, epitaxial growth mechanisms of 2D materials, molecular adsorption studies, and advanced characterization techniques. His work consistently appears in high-impact journals including Nature Communications, Physical Review Letters, and Advanced Materials.
He leads the Diffraction Methods and Electron Microscopy Group at Forschungszentrum Jülich, operating specialized instrumentation including an aberration-corrected spectroscopic low energy electron microscope for surface studies.
