Christophe DaussyView profile
Assistant Professor
Christophe Daussy is an Assistant Professor (Maître de Conférences) at Université Sorbonne Paris Nord, where he conducts research in the Laboratoire de Physique des Lasers (LPL). His work spans precision metrology, molecular spectroscopy, and physics education, with significant contributions to the redefinition of the International System of Units, particularly regarding the Boltzmann constant and thermodynamic temperature measurements. He maintains strong connections with the Laboratoire commun de métrologie LNE-CNAM and Systèmes de Référence Temps Espace. Daussy's research focuses on high-precision laser spectroscopy, particularly for fundamental constant determinations and metrological applications. His work on the Boltzmann constant has been instrumental in the redefinition of the kelvin, and he has made significant contributions to quantum cascade laser stabilization, optical frequency dissemination, and the search for parity violation effects in chiral molecules. More recently, he has expanded his interests to include physics education research, particularly the integration of metrological concepts in biology education. His publication record shows consistent high-impact research since the early 2000s, with recent work spanning both fundamental metrology (Boltzmann constant measurements, quantum cascade laser stabilization) and science education (metrological concepts in biology courses). His work appears in prestigious journals including Physical Review Letters, Metrologia, and Nature Photonics. Daussy has also been active in developing educational tools like the LightBox kit for optics education. Daussy leads research within the Metrology, Molecules and Fundamental Tests group at LPL, focusing on precision molecular spectroscopy for fundamental physics tests and metrological applications. His laboratory work combines advanced laser techniques with precision measurement methodologies to address fundamental questions in physics while maintaining practical applications in metrology.



