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Charles M. BachmannView profile

Professor

• Hyperspectral Remote Sensing
• Radiative Transfer Modeling
• Goniometers
• +7 more

Charles M. Bachmann is a Professor at the Chester F. Carlson Center for Imaging Science , part of the College of Science at Rochester Institute of Technology (RIT) . He also holds the Frederick and Anna B. Wiedman Chair and serves as the CIS Graduate Program Coordinator since 2016. His research focuses on hyperspectral remote sensing of coastal and desert environments, with expertise in BRDF and radiative transfer modeling, goniometer development, and manifold/graph algorithms for multi-sensor imagery analysis. Recent work emphasizes UAS-based soil moisture and carbon mapping for climate studies. Education : AB in Physics (Princeton, 1984), Sc.M. (1986) and Ph.D. (1990) in Physics (Brown University). Scientific Awards : U.S. Patents for hyperspectral remote sensing methods. Teaching : Radiometry, Radiative Transfer, Mathematical Methods of Imaging Science, and graduate thesis/research courses. Students : Mentored research on soil moisture, coastal biomass, and UAS applications.

• Optical Metrology
• Bidirectional Reflectance Distribution Function (BRDF)
• Bidirectional Transmittance Distribution Function (BTDF)
• +3 more

Robin Aschan is a Postdoctoral Researcher at Aalto University, affiliated with the Department of Electrical Engineering and Automation and the Metrology Research Institute. Their work centers on precision optical measurement techniques for reflectance and transmittance characterization. Research interests include: Optical Metrology Bidirectional Reflectance Distribution Function (BRDF) Bidirectional Transmittance Distribution Function (BTDF) Radiative Transfer Modeling Spectral Reflectance and Transmittance Measurements Near Infrared Spectroscopy Recent publications (2024-2025) demonstrate expertise in BTDF/BRDF measurement protocols, SI-traceable validation methods, and multilateral facility comparisons. Research spans visible to near-infrared spectra with applications in aerospace, remote sensing, and climate monitoring systems. No scientific awards were mentioned in the provided information. Active grants include: SRT i-10 xDDiff (2024-2027): Multidimensional optical diffusion for appearance measurement PaRaMetriC (2022-2025): Metrological framework for passive radiative cooling MetEOC-4 (2020-2023): SI-traceable climate observing systems BxDiff (2019-2022): New quantities for appearance measurement No student advising roles were documented. Collaborative work occurs through the Metrology Research Institute with international partners across European metrology networks.

Gaël ObeinView profile

Associate Professor

• Optical Metrology
• Photometry
• Spectrophotometry
• +4 more

Gaël Obein is a Senior Lecturer (HDR) and Associate Professor at Conservatoire National des Arts et Métiers (CNAM) in Paris, France. He serves as Director of LNE-CNAM, the national metrology laboratory for radiometry, photometry, temperature, and length, and leads the 'Radiometrics/Photonics' team. His academic career spans roles at CNAM, Paris VI, NIST (USA), and MNHN, with a PhD in 'Physical Systems and Metrology' (2003) and HDR since 2019. President of French Lighting Association (AFE) Secretary of CIE Division 2 Coordinator of four European research projects (2013–2027) Expert in BRDF, BSSRDF, and BTDF metrology His research focuses on optical metrology for material appearance, including: High-angular-resolution goniospectrophotometry (0.015°) µBRDF measurements for 50µm surfaces Specular gloss perception studies Development of primary standards for BRDF/BSSRDF/BTDF Light polarization and speckle effects Scientific Leadership includes: Secretary of CIE Division 2 Director of CIE TC2-85 and JTC17 Coordination of EURAMET-PR-K6 key comparisons Participation in 4 CIE technical committees Publications (2023–2024) cover bidirectional reflectance distribution functions, gloss metrology, spectral irradiance traceability, and material appearance modeling. Projects include 'xDReflect', 'BiRD', 'BxDiff', and 'xDDiff', addressing multidimensional optical diffusion and appearance measurement standards.

• Optical Metrology
• Radiometry
• Thin Film Characterization
• +2 more

Farshid Manoocheri is a Researcher at the Department of Electrical Engineering and Automation, School of Electrical Engineering, Aalto University, affiliated with the Metrology Research Institute. His research focuses on Optical Metrology and Radiometry , specializing in emissivity/reflectivity measurements for passive radiative cooling, BTDF characterization, and SI-traceable optical protocols. Key applications span Thin Film Characterization for nanotechnology and Remote Sensing systems, with emphasis on measurement accuracy for micro/nanostructures. Analysis of his 10 recent publications (2023-2025) reveals three dominant trends: (1) Development of reference protocols for radiative transfer validation, (2) Advanced reflectometry techniques for multilayer nanostructures, and (3) Standardization of BTDF measurements across spectral ranges. His work consistently bridges fundamental metrology with energy-efficient technologies. As an active member of the Metrology Research Institute, he contributes to international scale comparisons and primary reference facility development, collaborating with institutions across Europe on optical measurement standardization.