Valery Sheverev

Valery Sheverev is an Industry Professor in the Department of Applied Physics at New York University's Tandon School of Engineering. He specializes in plasma physics, optics, and spectroscopy with applications spanning from environmental monitoring to pharmaceutical diagnostics.

Education:

• PhD in Physics (Plasma Physics and Chemistry) from Saint-Petersburg State University, 1985
• B.S./M.S. in Physics (Optics and Spectroscopy) from Saint-Petersburg State University, 1979

Research Focus: Dr. Sheverev's research encompasses several interconnected domains including optics and spectroscopy, particularly in the context of glow discharge plasma and its diverse applications. His work on micro-optical sensing has led to innovative sensor technologies, while his investigations into plasma aerodynamics bridge fundamental physics with practical aerospace applications. Additionally, his expertise in lighting technology and diagnostics of multiphase flows serves critical needs in pharmaceutical applications and environmental monitoring systems.

Publications & Innovation: Over the past decade, Dr. Sheverev has published extensively in peer-reviewed journals, with his research appearing in prestigious venues such as Journal of Applied Physics, Physical Review E, and Analytical Chemistry. His work demonstrates a consistent focus on advancing understanding in plasma physics applications, particularly in atmospheric glow discharge phenomena, acoustic-plasma interactions, and novel diagnostic techniques. The temporal distribution of his publications (2002-2010) reveals sustained productivity in plasma spectroscopy, micro-optical sensors, and environmental gas analysis.

Patents & Commercial Impact: Dr. Sheverev holds multiple US patents that translate his research into practical technologies:

• Gas Detection and Identification Apparatus (Patent No. 7,408,360, 2008)
• Micro-optical wall shear stress sensor (Patent No. 7,701,586, 2010)
• Shear stress measurement apparatus (Patent No. 7,770,463, 2010)
• Load cell system for measuring forces based on optical spectra shifts (Patent No. 8,276,463, 2011)

Contact Information:
Email: sheverev@nyu.edu
Phone: 646.997.3576
Office: 2MTC, Room 1002, NYU Tandon School of Engineering