About
Associate Professor Dr. Thomas Weirich is a group leader for Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB) techniques at the Joint Laboratory for Electron Microscopy (GFE) of RWTH Aachen University. His work focuses on advanced microscopy methods for materials analysis.
Contact: weirich@gfe.rwth-aachen.de, Ahornstr. 55, 52074 Aachen, Germany. Phone: +49 241 80-24349.
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