Sybille Hellebrand

Sybille Hellebrand is a Professor and Head of the Data Technology (DATE) department at the University of Paderborn, within the Faculty of Electrical Engineering, Computer Science and Mathematics. She leads research in testing methodologies, fault tolerance, and reliability engineering. Her work focuses on advanced testing techniques for nanoelectronic systems, including BIST (Built-In Self-Test), delay fault analysis, and interconnect reliability under process variations.

Key research areas include:

• Testing and diagnosis of electronic systems
• Robust testing under PVT (Process-Voltage-Temperature) variability
• Functional safety of interconnects
• Approximate communication for error-tolerant systems
• Hardware fault modeling and simulation

Recent publications emphasize advancements in storage-based BIST optimization, defect vs. fault coverage analysis, and cross-talk delay modeling using polynomial regression. She has contributed to international conferences such as European Test Symposium (ETS), IEEE Latin American Test Symposium (LATS), and International Symposium of EDA (ISEDA).

Teaching responsibilities include courses on systems engineering, quality assurance in microelectronics, and algorithms for test and diagnosis of systems-on-chip. Her work aligns with emerging challenges in nanoelectronics, including reliability under variations and fault-tolerant communication.

No specific awards or grants are listed in the provided texts, but her extensive publication record underscores her leadership in testing and reliability research. The DATE lab at Paderborn University serves as a core research hub for her activities.