About
Sandra Veljkovic is a Lecturer at the Faculty of Electronic Engineering, University of Nis, specializing in Microelectronics and Microsystems. She holds a Master’s degree (2019) and a Bachelor’s degree (2018) in Electronic Components and Microsystems from the same institution. Her research focuses on semiconductor reliability, radiation effects on electronics, and SPICE modeling of power devices. She is actively involved in national and international projects, with 12 scientific papers published in impact factor journals.
Education:
- Master’s Degree: 2019, Faculty of Electronic Engineering, University of Nis (Electronics and Microsystems)
- Bachelor’s Degree: 2018, Faculty of Electronic Engineering, University of Nis (Electronic Components and Microsystems)
Research Interests:
- Power VDMOS transistors reliability under stress conditions
- Radiation effects on semiconductor devices
- Self-heating and NBT stress analysis
- SPICE model development for semiconductor components
Publications Trends: Her work emphasizes practical applications of semiconductor reliability analysis, with a focus on radiation testing, thermal stress effects, and device performance under extreme conditions. Recent contributions include advancements in SPICE modeling for radiation sensors and NBTI stress mitigation strategies in power electronics.
Professional Affiliations:
- Member of the SSCS Chapters Steering Committee
- Chair of IEEE ED/SSC University of Nis Student Branch
- Member of IEEE & Serbian Ceramic Society (SKD)
- Student Representative for Region 8 in SSCS Ad Hoc Committee
- European Chair for Arduino Contest
- Member of IEEESTEC Conference Secretariat
Labs/Teams: Actively involved in research groups investigating power electronics reliability and semiconductor device characterization at the Faculty of Electronic Engineering.
