Robert Geer

Dr. Robert Geer is Professor in the College of Nanotechnology, Science, and Engineering at the University at Albany. He holds a PhD in Experimental Condensed Matter Physics from the University of Minnesota (1991) and BS in Physics from Miami University (1986).

His research develops nanoscale metrology techniques including ultrasonic force microscopy and plasmon-enhanced optical spectroscopy. Applications focus on semiconductor materials, low-k dielectrics, and molecular electronic devices.

Publications demonstrate advancement in nanomechanical imaging, thin-film characterization, and semiconductor processing. Research bridges fundamental nanoscience with industrial applications.

Awards:

• National Research Council Research Associate (1992-1995)
• IBM Graduate Fellowship (1990-1991)

Dr. Geer directs research on CMP processing and nanoscale materials characterization, supported by NSF, SRC, ONR, and industry partners.