Mathieu Frégnaux

Mathieu Frégnaux is a Researcher at the Lavoisier Institute of Versailles (ILV), affiliated with the University of Versailles Saint-Quentin-en-Yvelines. He holds dual roles as a Research Engineer at CNRS and co-manager of the CEFS2 facilities. His work focuses on advanced material characterization techniques, including photoemission (XPS/UPS/PEEM), spectroscopic ellipsometry, and optical methods like photoluminescence and Raman spectroscopy. He actively collaborates with industry partners such as Thales, TotalEnergies, and Valeo.

• Education: PhD in Condensed Matter Physics (2012) from University of Lorraine, Metz. Thesis: Elaboration and characterization of cadmium sulfide nanocrystals.
• Research Interests: Surface and material science, with expertise in semiconductors (II-VI, III-V), oxides (perovskites), and 2D materials. Specializes in operando XPS, synchrotron-based techniques (TEMPO/HERMES), and in situ device characterization.

Prior roles include postdoctoral research at CEA Grenoble (2D TMDs for electronics) and teaching/research at University of Strasbourg (silicon/germanium nanocrystals for photovoltaics). He also manages laser safety and optical characterization facilities at ILV.