Ian MacLaren

Dr. Ian MacLaren is a Reader in Physics & Astronomy at the University of Glasgow's School of Physics and Astronomy. His research focuses on advanced electron microscopy techniques, including quantitative electron energy loss spectroscopy (EELS) and 4D scanning transmission electron microscopy (STEM), applied to study nanoscale materials such as functional oxides, high-strength steels, optical coatings, and mineral structures. He leads the Materials Sciences Applications section for the journal Microscopy and Microanalysis. His work emphasizes structural and chemical characterization at atomic resolution, with applications in energy, aerospace, and gravitational wave physics.

Research Interests: Dr. MacLaren’s expertise spans electron microscopy innovations, including DualEELS, ultra-high energy loss spectroscopy, and fast pixelated detector technologies. His studies address challenges in nanomaterials, thin film engineering, and defect analysis, with a focus on materials for high-precision applications like gravitational wave detectors. Recent projects include analyzing domain structures in ferroelectric materials, bubble formation in metals, and strain effects in nanomaterials.

Publications & Trends: His 166+ publications (2000–2025) highlight advancements in microscopy techniques and material characterization. Key themes include optimizing EELS for high-energy losses, developing 4D-STEM for dynamic imaging, and studying defects in functional oxides and alloys. Recent work emphasizes compressive sensing for faster, lower-dose imaging and correcting EELS artifacts for accurate chemical analysis.

Labs & Teams: Collaborates with international groups on structural and chemical nanocharacterization. Active in open-source software development for electron microscopy data analysis, advancing tools like Atomap for atomic resolution imaging.