Eike Trumann

Eike Trumann is a research assistant at the Chair for Chip Design for Embedded Computing, Institute of Theoretical Computer Science, Technische Universität Braunschweig (Germany). His work focuses on fault-tolerant hardware architectures and radiation effects on electronic circuits.

• Current affiliation: Faculty of Electrical Engineering, Information Technology, Physics
• Research projects: RADHARD (characterization of electronic components under radiation)

Research interests center on microelectronics reliability, radiation-induced faults, and embedded computing design. This aligns with TU Braunschweig's Engineering for Health core research area through applications in medical electronics resilience and nanoscale measurement technologies.

Publications demonstrate expertise in neutron radiation effects on SRAM-FPGA architectures, simulation of single-event upsets, and radiation-hardening methodologies for 28nm/180nm process technologies.

Education:

• M.Sc. Systems Engineering (Embedded Systems/Software), Universität Bremen (2017-2020)
• B.Sc. Systems Engineering (Embedded Systems/Software), Universität Bremen (2012-2017)